goepel-hardware

SCAN BOOSTER
The ScanBooster™ product family compliments the spectrum of SCANFLEX® solutions in low to
mid-range performance applications. Available family members are ScanBooster PCI,
ScanBooster USB, and ScanBooster PP (for PCI bus, USB bus, and Parallel Port, respectively),
supporting test, PLD programming and Flash in-system programming.
The controller range provides optimal solutions in particular for standard applications with
high cost pressure and lower performance requirements.

ScanBooster/PCI and ScanBooster/USB are equipped with two independent TAPs and supports
a programmable TCK frequency up to 16MHz. Both TAP are independently programmable with
regard to output voltage, input voltage, output impedance, and input impedance. By utilizing
GÖPEL electronic’s CION™ ASICs as driver circuits, the TAPs have outstandingly good signal
integrity in combination with special features for interface protection. The controller offers
additional resources such as dynamic 32bit Parallel I/O, trigger signals, an SCP bus for system
extensions and a specific interface for parallel gang testing of up to eight UUT.

The ScanBooster/PCI and ScanBooster/USB are interface compatible to previous Boundary
Scan controller generations from GÖPEL electronic. The ScanBooster products are fully
supported by the industry leading Boundary Scan software SYSTEM CASCON™.

Main Features:

Boundary Scan controller for PCI or USB2.0, respectively, fully compliant with IEEE Std 1149.1
Provides 2 independent TAP with programmable I/O voltage and impedence
32 bit parallel Input Output Port (PIO)
2 analog I/O
Complete software support by SYSTEM CASCON™
Optional Accessories:

Various options available for the SCAN BOOSTER family include a Signal Access Board, a
Scanpath Extension Box, and a Gang Access Board.

Boundary Scan Coach, Scan Trainer Board

The Boundary Scan Coach, is a simple demo board that can be used in conjunction with
SYSTEM CASCON software or with a free, interactive learning software illustrating the basics
of JTAG/Boundary Scan technology and Boundary Scan applications in particular.

The Scan Trainer Board, a more complex demo board, can be used to learn more about the
intricacies of more advanced Boundary Scan applications found in practice.

We offer a 30 day evaluation of our software and hardware products, which includes your
choice of demo board to allow you to quickly familiarize yourself with the Boundary Scan
technology and with GOEPEL Boundary Scan software in particular. To request an evaluation
system, please contact;

GOEPEL offers the industry's widest selection of state-of-the-art JTAG/Boundary Scan
hardware products. Our SCANFLEX Boundary Scan hardware architecture was honored
with the Best in Test award in 2006.
SCANFLEX® creates an open Boundary Scan hardware platform, surpassing
competitive products especially in performance, modularity and flexibility.

Our product portfolio includes:

SCANFLEX hardware platform (Boundary Scan controllers and accessories)
SCAN BOOSTER Boundary Scan controller
Boundary Scan demonstration and learning products

SCANFLEX® is a revolutionary new hardware platform, created to enable for extended Boundary
Scan test and ISP solutions, taking full advantage of the technical potential provided by today’s
and tomorrow’s standards. SCANFLEX excels when it comes to speed, flexibility, and modularity
of a Boundary Scan test system. But it does not stop there, adding new capabilities for analog
and mixed-signal test not found in competitive products.
SCANFLEX benefits
SCANFLEX concept
Applications benefiting from SCANFLEX
SCANFLEX components (Controllers, Transceivers, I/O features modules) and features
The standardization of IEEE-Std. 1149.1 (JTAG / Boundary Scan) in 1990 set the foundation for
one of the most successful test technologies. Additional standards, based on the IEEE-Std.
1149.1 architecture, have been developed to support innovative test and in-system
programming applications, in particular IEEE-Std. 1532, IEEE-Std. 1149.4, and IEEE-Std. 1149.6,
and further standard development efforts are under way.
SCANFLEX® excels with:

Total Modularity
Modular platform consisting of SCANFLEX Controller, SCANFLEX TAP-Transceiver, and
SCANFLEX I/O modules allowing individually (re)configurable solutions
Modular expandable number of (up to 8) parallel, independent TAP and (up to 31) independent
I/O modules, ensuring open scalability of required resources
Modular, interchangeable TAP Interface Cards (TIC) support a variety of interface types and
integration environments

Extreme Flexibility
Flexible electrical signal termination (up to 8 per TAP programmable interface parameters)
Flexible distribution of the individual TAP’s and I/O modules with distances of up to 10m/33ft
from the Controller without performance drop
Flexible analog and digital resources on every TAP-Transceiver as standard configuration,
systematically expandable with optional I/O modules

High-performance SPACETM II Controller Chip Set supporting HYSCANTM for simultaneous
handling of parallel I/O pattern and serial scan pattern up to 80MHz on 8 independent TAP’s
Highly efficient synchronization of analog, digital and mixed signal resources with dynamic TAP
operations and external trigger events
Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect
Feature and FASTSCALETM Technology

SCANFLEX® concept – an overview (example configuration)

SCANFLEX® systems are controlled through a JTAG/Boundary Scan Controller. This controller is
responsible for simultaneous generation and dynamic distribution of serial patterns, parallel
patterns, and control sequences, supporting three standard SFX and SFX/LS Interfaces. All
SCANFLEX Controllers are available in three performance classes (A/B/C). Refer to this product
matrix.

Test and ISP applications benefiting from SCANFLEX®

Consistent hardware platform for a multitude of test and programming procedures
Modular concept ensures lowest overhead through scalable, customizable solutions
Optimized for integration into 3rd party Flying Probe, ICT, MDA, or Functional Test
State-of-the-art system architecture with data splitting for serial and parallel resources
Extended Boundary Scan tests with highest possible fault coverage
The latest link technologies ensure high performance data transmission
Open architecture ensures efficient support for today’s and tomorrow's standards
Continuous expansion of the product portfolio, worldwide application support
Custom specific front-end solutions through SCANFLEX Engineering
Complete support of all hardware features through SYSTEM CASCON™ software

The third major component in a SCANFLEX® system is the optional I/O Module. These I/O
modules are controlled independently from any other resources in the system through the
SFX/LS interface. If the number of required SCANFLEX I/O Modules is very small (only 1 to 2
modules needed) the modules can be plugged directly onto the TAP-Transceiver, eliminating
any additional cabling. Alternatively, I/O modules can be put into SCANFLEX Carriers, connected
to the Controller or the TAP Transceiver through a SFX/LS cable (0.5m/1.5ft, 1m/3ft, 3m/10ft, or
5m/15ft). SCANFLEX I/O Modules are used to extend the performance and capabilities of the
Boundary Scan system with additional test instruments and programming resources, highly of
standard modules and development of custom modules are offered through GÖPEL electronic’
s engineering services. GÖPEL has also introduced the first SCANFLEX I/O modules with
VarioCore™ technology.

BACK

TAP-Transceiver modules. These modules are
connected to the controller with the SFX cable
(available in 2m/6ft, 5m/15ft, and 10m/33ft
lengths). from the controller into respective TAP
signals are provided through interchangeable
TAP Interface Cards (TIC), allowing a nearly
infinite range of Cards (TIC), allowing a nearly
infinite range of signal conditioning, and
integration environments, front-end adaptations
for various signal types, including custom
specific variants. SCANFLEX TAP Transceivers
are provided as desktop configurations, as well
as in rack-mountable housings, and they can be
adapted to custom specifications. As a standard
configuration, TAP Transceivers also include
analog and digital I/O resources, typically at least
one SFX I/O slot, and one additional SFX/LS
interface, providing ample of resources for
extended Boundary Scan test solutions.